Mr. William Luer Profile

William Luer

at MITRE Corp

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Proceedings Article | 12 April 2021 Presentation + Paper

Using deep perceptual embeddings as a quality metric for synthetic imagery

William Luer, Josh Harguess

Proceedings Volume 11733, 1173306 (2021) https://doi.org/10.1117/12.2587943

KEYWORDS: Data modeling, Image quality, Satellites, Satellite imaging, Earth observing sensors

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The potential of synthetic image generation in machine learning applications has a myriad of both benefits and drawbacks. Synthetic datasets are valuable when real datasets are costly to acquire or difficult to share. Although synthetic imagery has improved in quality over the years, automated evaluation of the synthetic data remains challenging. For example, the Fréchet inception distance does not always correlate with perceptual quality and the perceptual path length operates at the model level rather than the data level. In this work, we propose a new evaluation metric that both correlates with perceptual quality and operates at the data level so that it can function on datasets from any domain. We do this by mapping high dimensional images into a lower dimensional, perceptually disentangled embedding space and computing the distance between distributions of embeddings within this space. We utilize a convolutional autoencoder trained with a linear combination of pixelwise and perceptual losses to perform the mapping and use existing metrics to measure the distance between the distributions of embeddings. We demonstrate efficacy of this metric on the CIFAR-10 dataset.

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