William M. Meshell
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 August 2004
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Nonuniformity corrections, Infrared sensors, Data modeling, Sensors, Calibration, Image processing, Time metrology, Black bodies, Projection systems, Sensor calibration

Proceedings Article | 12 September 2003
Proc. SPIE. 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
KEYWORDS: Nonuniformity corrections, MATLAB, Cameras, Sensors, Calibration, Image processing, Image sensors, Projection systems, Infrared radiation, Cryogenics

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