William Roth
Research Assistant/PhD Student at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | April 1, 2015
Proc. SPIE. 9437, Structural Health Monitoring and Inspection of Advanced Materials, Aerospace, and Civil Infrastructure 2015
KEYWORDS: Reflection, Manufacturing, Inspection, Structural health monitoring, Finite element methods, Aluminum, Electromagnetic coupling, Semiconducting wafers, Adhesives, Active sensors

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