Dr. William Wade Sapp
Director of Technology at American Science and Engineering Inc
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | November 26, 2002
Proc. SPIE. 4786, Penetrating Radiation Systems and Applications IV
KEYWORDS: Backscatter, Imaging systems, Sensors, Image segmentation, X-rays, Inspection, Beam shaping, X-ray imaging, Environmental sensing, Prototyping

PROCEEDINGS ARTICLE | December 18, 2000
Proc. SPIE. 4142, Penetrating Radiation Systems and Applications II
KEYWORDS: Backscatter, Imaging systems, X-rays, X-ray sources, Inspection, Spatial resolution, X-ray imaging, X-ray detectors, Digital x-ray imaging

PROCEEDINGS ARTICLE | December 28, 1998
Proc. SPIE. 3575, Enforcement and Security Technologies
KEYWORDS: Electron beams, Iron, Imaging systems, Sensors, Signal attenuation, X-rays, X-ray sources, Inspection, Image quality, X-ray imaging

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