William A. Terre
Vice President/Business Development at FLIR Systems Inc
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 31 May 2005 Paper
Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.603875
KEYWORDS: Cameras, Thermography, Photonic microstructures, Infrared cameras, Miniature imaging systems, Manufacturing, Video, Calibration, Forward looking infrared, Electronics

Proceedings Article | 30 August 2004 Paper
William Terre, Robert Cannata, Patrick Franklin, Alfredo Gonzalez, Eric Kurth, William Parrish, Kevin Peters, Tommie Romeo, Diane Salazar, Robert VanYsseldyk
Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.542766
KEYWORDS: Bolometers, Cameras, Microbolometers, Semiconducting wafers, Readout integrated circuits, Staring arrays, Packaging, Multiplexers, Electronics, Forward looking infrared

Proceedings Article | 30 August 2004 Paper
Joseph Kostrzewa, William Terre, Jeff Frank, Roy Malmberg, Larry Switzer, Wayne Antesberger, Gwendolyn Newsome
Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.546746
KEYWORDS: Weapons, Thermography, Imaging systems, Infrared radiation, Reticles, Iron, Infrared imaging, Camera shutters, Sensors, Thermal weapon sights

Proceedings Article | 10 October 2003 Paper
William Terre, Robert Cannata, Patrick Franklin, Alfredo Gonzalez, Eric Kurth, Hiep Ly, William Parrish, Kevin Peters, Tommie Romeo, Robert VanYsseldyk
Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.487317
KEYWORDS: Bolometers, Semiconducting wafers, Microbolometers, Silicon, Readout integrated circuits, Metrology, Cameras, Metals, Reactive ion etching, Process control

Proceedings Article | 10 October 2003 Paper
Joseph Kostrzewa, William Meyer, George Poe, William Terre, Thomas Salapow, John Raimondi
Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.497535
KEYWORDS: Thermography, Cameras, Imaging systems, Staring arrays, Infrared imaging, Temperature metrology, Sensors, Thermal effects, Safety, Infrared radiation

Showing 5 of 13 publications
Conference Committee Involvement (2)
Infrared Technology and Applications XLIII
9 April 2017 | Anaheim, CA, United States
Infrared Technology and Applications XLII
18 April 2016 | Baltimore, MD, United States
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