Dr. William B. Thompson Profile

Dr. William B. Thompson

Research Scientist at SLAC

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 1 June 2011 Paper

Creating nanohole arrays with the helium ion microscope

Mohan Ananth, Bill Thompson, Lewis Stern, John Notte, Chuong Huynh, Larry Scipioni, Colin Sanford, David Ferranti

Proceedings Volume 8036, 80360M (2011) https://doi.org/10.1117/12.887497

KEYWORDS: Helium, Gallium, Gold, Ions, Ion beams, Chemical species, Scanning helium ion microscopy, Scanning electron microscopy, Sputter deposition, Image resolution

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Proceedings Article | 3 June 2010 Paper

Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging

Lewis Stern, Chuong Huynh, John Notte, Dave Ferranti, William Thompson, Colin Sanford, Larry Scipioni

Proceedings Volume 7729, 77290J (2010) https://doi.org/10.1117/12.861488

KEYWORDS: Helium, Plasma, Carbon monoxide, Ions, Contamination, Scanning helium ion microscopy, Oxides, Carbon, Copper, Argon

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Proceedings Article | 19 May 1995 Paper

Toward a commercial gas field ion source

William Thompson, S. Etchin, Christoph Wilbertz, A. Armstrong, Raymond Hill, Sigfried Kalbitzer, A. Saxonis, R. Percival

Proceedings Volume 2437, (1995) https://doi.org/10.1117/12.209185

KEYWORDS: Ions, Helium, Gallium, Tungsten, Ion beams, Interferometers, Liquids, Neon, Optical spheres, Argon

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Proceedings Article | 13 May 1994 Paper

Advances in focused ion-beam repair of opaque defects

William Thompson, David Ferranti, John Morgan, William Joyce

Proceedings Volume 2194, (1994) https://doi.org/10.1117/12.175828

KEYWORDS: Quartz, Gallium, Etching, Photomasks, Opacity, Ions, Phase shifts, Ion beams, Sputter deposition, Glasses

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Proceedings Article | 1 June 1992 Paper

Focused ion-beam process monitoring

Randall Lee, William Thompson

Proceedings Volume 1673, (1992) https://doi.org/10.1117/12.59828

KEYWORDS: Ions, Semiconducting wafers, Electrons, Ion beams, Metals, Imaging systems, Gallium, Image processing, Microchannel plates, Oxides

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Proceedings Volume Editor (1)

SPIE Conference Volume | 3 September 1993

Charged-Particle Optics

Conference Committee Involvement (1)

Charged-Particle Optics

15 July 1993 | San Diego, CA, United States

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