Prof. Willie J. Padilla
Professor at Duke Univ
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (17)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10622, 2017 International Conference on Optical Instruments and Technology: Micro/Nano Photonics: Materials and Devices
KEYWORDS: Metamaterials, Resonators, Terahertz radiation, Electromagnetism, Absorption

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10383, Terahertz Emitters, Receivers, and Applications VIII
KEYWORDS: Metamaterials, Computational imaging, Imaging systems, Spatial light modulators, Terahertz radiation, Frequency division multiplexing, Tunable metamaterials

PROCEEDINGS ARTICLE | June 12, 2017
Proc. SPIE. 10194, Micro- and Nanotechnology Sensors, Systems, and Applications IX
KEYWORDS: Microelectromechanical systems, Thermography, Metamaterials, Nanotechnology, Sensors, Control systems, Infrared radiation, Electromagnetism, Temperature metrology, Current controlled current source

PROCEEDINGS ARTICLE | June 9, 2017
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: Metamaterials, Quadrature amplitude modulation, Millimeter wave imaging, Imaging systems, Image processing, Spatial light modulators, Signal processing, High speed imaging, Communication engineering, Electromagnetic metamaterials

PROCEEDINGS ARTICLE | April 19, 2017
Proc. SPIE. 10103, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X
KEYWORDS: Metamaterials, Plasmonics, Dielectrics, Electromagnetic radiation, Optical activity, Structural design, Dichroic materials, Terahertz spectroscopy, Chiral metamaterials, Dielectric polarization

PROCEEDINGS ARTICLE | November 9, 2016
Proc. SPIE. 9918, Metamaterials, Metadevices, and Metasystems 2016
KEYWORDS: Metamaterials, Imaging systems, Control systems, Electromagnetic metamaterials, Current controlled current source

Showing 5 of 17 publications
Conference Committee Involvement (8)
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
14 April 2019 | Baltimore, Maryland, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications V
16 April 2018 | Orlando, Florida, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
12 April 2017 | Anaheim, California, United States
Image Sensing Technologies: Materials, Devices, Systems, and Applications III
20 April 2016 | Baltimore, Maryland, United States
Metamaterials
4 April 2016 | Brussels, Belgium
Showing 5 of 8 published special sections
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