Dr. Wojciech Słysz
at Institute of Electron Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (18)

PROCEEDINGS ARTICLE | May 15, 2017
Proc. SPIE. 10229, Photon Counting Applications 2017
KEYWORDS: Photodetectors, Ferromagnetics, Sputter deposition, Annealing, Magnetism, Superconductors, Sapphire, Electroluminescent displays, Thermodynamics, Temperature metrology

PROCEEDINGS ARTICLE | December 22, 2016
Proc. SPIE. 10175, Electron Technology Conference 2016
KEYWORDS: Mirrors, Optical lithography, Image segmentation, Photons, Silicon, Diffusion, Reflectivity, Photodiodes, Photomasks, Aluminum

PROCEEDINGS ARTICLE | May 6, 2015
Proc. SPIE. 9504, Photon Counting Applications 2015
KEYWORDS: Photodetectors, Nanostructures, Ferromagnetics, Nickel, Interfaces, Magnetism, Superconductors, Bridges, Temperature metrology, Photonic nanostructures

PROCEEDINGS ARTICLE | August 19, 2014
Proc. SPIE. 9291, 13th International Scientific Conference on Optical Sensors and Electronic Sensors
KEYWORDS: X-rays, Silicon, Scintillators, Photography, Photodiodes, Detector arrays, Aluminum, Scintillation, X-ray detectors, Lead

PROCEEDINGS ARTICLE | August 19, 2014
Proc. SPIE. 9291, 13th International Scientific Conference on Optical Sensors and Electronic Sensors
KEYWORDS: Sensors, Etching, Silicon, Diffusion, Detector development, Aluminum, Boron, Phosphorus, Semiconducting wafers, Oxidation

PROCEEDINGS ARTICLE | July 25, 2013
Proc. SPIE. 8902, Electron Technology Conference 2013
KEYWORDS: Reflection, Argon, Annealing, Crystals, Superconductors, Transmission electron microscopy, Sapphire, Structural analysis, Niobium, Corundum

Showing 5 of 18 publications
Conference Committee Involvement (2)
Photon Counting Applications
19 April 2011 | Prague, Czech Republic
Photon Counting Applications
21 April 2009 | Prague, Czech Republic
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