Dr. Wojtek J. Walecki
R&D Manager at Frontier Semiconductor Inc
SPIE Involvement:
Corporate and Exhibitor Committee | Author
Publications (17)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Fabry–Perot interferometers, Semiconducting wafers, Metrology, Wafer-level optics, Spectrometers, Semiconductors, Silicon, Phase measurement, Semiconductor manufacturing, Optical testing

PROCEEDINGS ARTICLE | March 9, 2015
Proc. SPIE. 9383, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIX
KEYWORDS: Metrology, Reflectivity, Diffusers, Manufacturing, Light emitting diodes, Nickel, Surface finishing, Specular reflections, Optics manufacturing, Surface roughness

PROCEEDINGS ARTICLE | June 1, 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Confocal microscopy, Microscopes, Objectives, Reflectivity, Microscopy, Mirrors, Reflection, Multiphoton microscopy, Stimulated emission depletion microscopy, Polarization

PROCEEDINGS ARTICLE | April 30, 2009
Proc. SPIE. 7322, Photonic Microdevices/Microstructures for Sensing
KEYWORDS: Fiber optics, Semiconducting wafers, Optical fibers, Sensors, Optics manufacturing, Interferometers, Reflectivity, Polarization, Fiber optics sensors, Michelson interferometers

PROCEEDINGS ARTICLE | September 10, 2008
Proc. SPIE. 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems
KEYWORDS: Solar cells, Quantum efficiency, Projection systems, Semiconducting wafers, Metrology, Cameras, Manufacturing, LCDs, Remote sensing, Structured light

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7064, Interferometry XIV: Applications
KEYWORDS: Solar cells, Quantum efficiency, Semiconducting wafers, Projection systems, Metrology, Cameras, Reflectivity, Phase shifts, Manufacturing, Structured light

Showing 5 of 17 publications
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