Dr. Wojtek J. Walecki
R&D Manager at Frontier Semiconductor Inc
SPIE Involvement:
Corporate and Exhibitor Committee | Author
Publications (17)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Wafer-level optics, Semiconductors, Fabry–Perot interferometers, Metrology, Spectrometers, Silicon, Optical testing, Semiconductor manufacturing, Phase measurement, Semiconducting wafers

PROCEEDINGS ARTICLE | March 9, 2015
Proc. SPIE. 9383, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIX
KEYWORDS: Metrology, Light emitting diodes, Nickel, Manufacturing, Reflectivity, Surface roughness, Diffusers, Specular reflections, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | June 1, 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Multiphoton microscopy, Polarization, Reflection, Microscopy, Reflectivity, Objectives, Stimulated emission depletion microscopy

PROCEEDINGS ARTICLE | April 30, 2009
Proc. SPIE. 7322, Photonic Microdevices/Microstructures for Sensing
KEYWORDS: Optical fibers, Fiber optics, Polarization, Interferometers, Sensors, Reflectivity, Fiber optics sensors, Semiconducting wafers, Optics manufacturing, Michelson interferometers

PROCEEDINGS ARTICLE | September 10, 2008
Proc. SPIE. 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems
KEYWORDS: Metrology, Cameras, Solar cells, Remote sensing, Quantum efficiency, Manufacturing, LCDs, Projection systems, Semiconducting wafers, Structured light

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7064, Interferometry XIV: Applications
KEYWORDS: Metrology, Cameras, Solar cells, Quantum efficiency, Manufacturing, Reflectivity, Projection systems, Semiconducting wafers, Phase shifts, Structured light

Showing 5 of 17 publications
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