Dr. Wojtek J. Walecki
CTO at Frontier Semiconductor Inc
SPIE Involvement:
Corporate and Exhibitor Committee | Author
Publications (20)

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Metrology, Clocks, Interferometers, Error analysis, Spectrometers, Interferometry, Multiplexing, Time metrology, Semiconducting wafers, Space reconnaissance

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Wafer-level optics, Semiconductors, Fabry–Perot interferometers, Moire patterns, Metrology, Spectroscopy, Silicon, Interferometry, Free space optics, Semiconducting wafers

PROCEEDINGS ARTICLE | February 19, 2018
Proc. SPIE. 10556, Advances in Display Technologies VIII
KEYWORDS: Thin films, Metrology, Light emitting diodes, Glasses, Data processing, Signal processing, Flat panel displays, Flat glass, Coded apertures, Thin film deposition

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Wafer-level optics, Semiconductors, Fabry–Perot interferometers, Metrology, Spectrometers, Silicon, Optical testing, Semiconductor manufacturing, Phase measurement, Semiconducting wafers

PROCEEDINGS ARTICLE | March 9, 2015
Proc. SPIE. 9383, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIX
KEYWORDS: Metrology, Light emitting diodes, Nickel, Manufacturing, Reflectivity, Surface roughness, Diffusers, Specular reflections, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | June 1, 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Multiphoton microscopy, Polarization, Reflection, Microscopy, Reflectivity, Objectives, Stimulated emission depletion microscopy

Showing 5 of 20 publications
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