Dr. Bernhard Musch Profile

Dr. Bernhard Musch

at Dr. Johannes Heidenhain GmbH

SPIE Involvement:

Author

Proceedings Article | 30 May 2003 Paper

Simultaneous measurement of surface topology and material distribution by polarization detection

Seyed Naghibi Saber, Werner Baetz, Wolfgang Holzapfel

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.501332

KEYWORDS: Polarization, Imaging systems, Refractive index, CCD image sensors, Charge-coupled devices, CCD cameras, Sensors, Reflection, Wave plates, Image sensors

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Proceedings Article | 18 October 2002 Paper

Absolute-distance interferometry (ADI) with randomly modulated optical wavelength

Werner Baetz, Wolfgang Holzapfel

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467262

KEYWORDS: Modulation, Semiconductor lasers, Sensors, Frequency modulation, Linear filtering, Phase shift keying, Interferometry, Interferometers, Signal detection, Signal processing

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SPIE Journal Paper | 1 September 2002

Optical topography measurement applying optimal filtering of local slope and surface height data

Wolfgang Holzapfel, Manfried Sofsky, Ulrich Neuschaefer-Rube

OE, Vol. 41, Issue 09, (September 2002) https://doi.org/10.1117/12.10.1117/1.1497175

KEYWORDS: Error analysis, Optimal filtering, Optical testing, Polarization, Optical engineering, Interferometry, Charge-coupled devices, Glasses, Shearography, Refractive index

Proceedings Article | 4 October 2001 Paper

Optomechatronic response of high-performance force-sensing microlasers

Wolfgang Holzapfel, Michael Kobusch, Ulrich Neuschaefer-Rube

Proceedings Volume 4564, (2001) https://doi.org/10.1117/12.444099

KEYWORDS: Sensors, Opto mechatronics, Mathematical modeling, Nd:YAG lasers, Modulation

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Proceedings Article | 17 September 1997 Paper

Microellipsometric surface measurement

Jochen Doberitzsch, Wolfgang Holzapfel, Ulrich Neuschaefer-Rube

Proceedings Volume 3098, (1997) https://doi.org/10.1117/12.281152

KEYWORDS: Refractive index, Objectives, Sensors, Glasses, Microscopes, Beam splitters, Reflection, Signal detection, Ellipsometry, Gold

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Proceedings Article | 16 August 1996 Paper

Measurements of the ellipsometric parameters of optical components inside an active laser

Wolfgang Holzapfel, Stephan Neuschaefer-Rube

Proceedings Volume 2873, (1996) https://doi.org/10.1117/12.246200

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Proceedings Article | 16 August 1996 Paper

Ellipsometric topometry for technical surfaces

Wolfgang Holzapfel, Ulrich Neuschaefer-Rube, Jochen Doberitzsch

Proceedings Volume 2873, (1996) https://doi.org/10.1117/12.246211

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Proceedings Article | 16 August 1996 Paper

Photoelastic microellipsometer: a new tool for high-resolution force vector measurements

Wolfgang Holzapfel, Ulrich Neuschaefer-Rube, Stephan Neuschaefer-Rube

Proceedings Volume 2873, (1996) https://doi.org/10.1117/12.246212

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SPIE Journal Paper | 1 May 1995

Wavelength determination of semiconductor lasers: precise but inexpensive

Jan Braasch, Wolfgang Holzapfel, Stephan Neuschaefer-Rube

OE, Vol. 34, Issue 05, (May 1995) https://doi.org/10.1117/12.10.1117/12.201655

KEYWORDS: Sensors, Semiconductor lasers, Diodes, Optical amplifiers, Light sources, Temperature metrology, Photodiodes, Optical testing, Beam controllers, Precision optics

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Proceedings Article | 1 March 1994 Paper

Noise-modulated laser diode interferometer and its application to range finding

Wolfgang Holzapfel, Werner Baetz, Jan Braasch

Proceedings Volume 2004, (1994) https://doi.org/10.1117/12.172582

KEYWORDS: Semiconductor lasers, Modulation, Interferometers, Signal detection, Sensors, Photodetectors, Interferometry, Signal processing, Frequency modulation, Linear filtering

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Proceedings Article | 25 November 1993 Paper

Beam design of a noncooperative interferometer

Michael Hoelscher, Wolfgang Holzapfel

Proceedings Volume 2000, (1993) https://doi.org/10.1117/12.163638

KEYWORDS: Sensors, Signal detection, Semiconductor lasers, Modulation, Interferometers, Signal to noise ratio, Speckle pattern, Scattering, Speckle, Light scattering

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SPIE Journal Paper | 1 November 1992

Analog optical processing applying PMMA-modulator-polarizer configurations

Wolfgang Holzapfel, Chun Ye

OE, Vol. 31, Issue 11, (November 1992) https://doi.org/10.1117/12.10.1117/12.60047

KEYWORDS: Modulators, Polarizers, Optical signal processing, Polymethylmethacrylate, Phased array optics, Signal processing, Analog electronics, Polarization, Signal detection, Sensors

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Showing 5 of 12 publications

Conference Committee Involvement (9)

Modeling Aspects in Optical Metrology VIII

21 June 2021 | Online Only, Germany

Modeling Aspects in Optical Metrology VII

24 June 2019 | Munich, Germany

Modeling Aspects in Optical Metrology

26 June 2017 | Munich, Germany

Modeling Aspects in Optical Metrology V

23 June 2015 | Munich, Germany

Modeling Aspects in Optical Metrology IV

13 May 2013 | Munich, Germany

Showing 5 of 9 Conference Committees

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