Dr. Wolfgang Holzapfel
at DR JOHANNES HEIDENHAIN GmbH
SPIE Involvement:
Conference Program Committee | Author
Publications (12)

Proceedings Article | 30 May 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Polarization, Imaging systems, Refractive index, CCD image sensors, Charge-coupled devices, CCD cameras, Sensors, Reflection, Wave plates, Image sensors

Proceedings Article | 18 October 2002
Proc. SPIE. 4902, Optomechatronic Systems III
KEYWORDS: Modulation, Semiconductor lasers, Sensors, Frequency modulation, Linear filtering, Phase shift keying, Interferometry, Interferometers, Signal detection, Signal processing

SPIE Journal Paper | 1 September 2002
OE Vol. 41 Issue 09
KEYWORDS: Error analysis, Optimal filtering, Optical testing, Polarization, Optical engineering, Interferometry, Charge-coupled devices, Glasses, Shearography, Refractive index

Proceedings Article | 4 October 2001
Proc. SPIE. 4564, Optomechatronic Systems II
KEYWORDS: Sensors, Opto mechatronics, Mathematical modeling, Nd:YAG lasers, Modulation

Proceedings Article | 17 September 1997
Proc. SPIE. 3098, Optical Inspection and Micromeasurements II
KEYWORDS: Refractive index, Objectives, Sensors, Glasses, Microscopes, Beam splitters, Reflection, Signal detection, Ellipsometry, Gold

Showing 5 of 12 publications
Conference Committee Involvement (8)
Modeling Aspects in Optical Metrology VII
24 June 2019 | Munich, Germany
Modeling Aspects in Optical Metrology
26 June 2017 | Munich, Germany
Modeling Aspects in Optical Metrology V
23 June 2015 | Munich, Germany
Modeling Aspects in Optical Metrology IV
13 May 2013 | Munich, Germany
Modeling Aspects in Optical Metrology
23 May 2011 | Munich, Germany
Showing 5 of 8 published special sections
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