Prof. Wolfgang Osten
Professor at Institut für Technische Optik
SPIE Involvement:
| Board of Directors | European Advisory Committee | Fellows Committee | Publications Committee | Fellow status | Conference Program Committee | Conference Co-Chair | Conference Chair | Symposium Chair | Symposium Committee | Author | Editor
Publications (303)

SPIE Journal Paper | November 2, 2018
JMI Vol. 5 Issue 04
KEYWORDS: Optical spheres, Tissues, Surgery, Interferometry, Elastography, Shearography, Signal to noise ratio, Tumors, Speckle, Silicon

PROCEEDINGS ARTICLE | September 14, 2018
Proc. SPIE. 10744, Laser Beam Shaping XVIII
KEYWORDS: Monochromatic aberrations, Light sources, Holograms, Holography, Speckle, Sensors, Denoising, Computer generated holography, Spatial light modulators, Speckle pattern

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Polarization, Speckle, Scattering, Light scattering, Speckle pattern, Stochastic processes, Correlation function

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Holography, Metrology, Digital holography, Interferometers, Sensors, Manufacturing, Inspection, Interferometry, Optical testing, Optical metrology

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Mirrors, Interferometers, Sensors, Calibration, Wavefronts, Objectives, Modulation transfer functions, Phase measurement, Phase transfer function, Fizeau interferometers

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Microelectromechanical systems, Microscopes, Refractive index, Interferometers, Sensors, Silicon, Inspection, Interferometry, Infrared radiation, Semiconducting wafers