Dr. Won Shik Park
Postdoctoral Fellow at Massachusetts Institute of Technology
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 30 September 2003 Paper
Proceedings Volume 5264, (2003) https://doi.org/10.1117/12.514998
KEYWORDS: Mirrors, Sensors, Motion measurement, Beam splitters, Laser sources, Reflectivity, 3D metrology, Laser systems engineering, Protactinium, Control systems

Proceedings Article | 27 November 2002 Paper
Hyungsuck Cho, Won Shik Park
Proceedings Volume 4789, (2002) https://doi.org/10.1117/12.455971
KEYWORDS: Inspection, Neural networks, Semiconducting wafers, Optical inspection, Manufacturing, Sensors, Image classification, Defect detection, Visual process modeling, Optics manufacturing

Proceedings Article | 18 October 2002 Paper
Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467338
KEYWORDS: X-ray imaging, X-rays, 3D modeling, X-ray sources, Reconstruction algorithms, 3D image processing, Calibration, Imaging systems, Spherical lenses, 3D image reconstruction

SPIE Journal Paper | 1 April 2002
OE, Vol. 41, Issue 04, (April 2002) https://doi.org/10.1117/12.10.1117/1.1457462
KEYWORDS: Mirrors, Sensors, 3D modeling, Mathematical modeling, Motion measurement, Optical engineering, 3D metrology, Helium neon lasers, Computer vision technology, Motion models

Proceedings Article | 4 October 2001 Paper
Won Park, Hyungsuck Cho, Yong-Kyu Byun
Proceedings Volume 4564, (2001) https://doi.org/10.1117/12.444100
KEYWORDS: Mirrors, Motion measurement, Sensors, Wave propagation, Actuators, 3D metrology, Helium neon lasers, Laser Doppler velocimetry, Doppler effect, Mathematical modeling

Showing 5 of 8 publications
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