Dr. Wouter D. Koek
Senior Scientist at TNO Science and Industry
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | March 13, 2018
Proc. SPIE. 10585, Metrology, Inspection, and Process Control for Microlithography XXXII
KEYWORDS: Diffraction, Sensors, Photons, X-rays, Reflectivity, Image resolution, 3D metrology, Photomasks, Semiconducting wafers, 3D image processing

PROCEEDINGS ARTICLE | February 22, 2017
Proc. SPIE. 10097, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems VI
KEYWORDS: Actuators, Mirrors, Optical design, Spatial frequencies, High power lasers, Wavefronts, Adaptive optics, Deformable mirrors, Extreme ultraviolet, Received signal strength

PROCEEDINGS ARTICLE | August 28, 2016
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Modulation, Imaging systems, Imaging systems, Speckle, Particles, Reflectivity, Surface roughness, Interferometry, Wavefronts, Specular reflections, Particle systems

PROCEEDINGS ARTICLE | March 9, 2015
Proc. SPIE. 9356, High-Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications IV
KEYWORDS: Diffraction, Imaging systems, Sensors, Wavefront sensors, Wavefronts, Optical testing, Wave propagation, Beam propagation method, Diffraction gratings, Shearing interferometers

PROCEEDINGS ARTICLE | April 21, 2005
Proc. SPIE. 5742, Practical Holography XIX: Materials and Applications
KEYWORDS: Holograms, Holography, 3D image reconstruction, Modulation, Polarization, Particles, Molecules, Multiplexing, Velocimetry, Absorption

PROCEEDINGS ARTICLE | December 8, 2003
Proc. SPIE. 5216, Organic Holographic Materials and Applications
KEYWORDS: Diffraction, Holograms, Holography, 3D image reconstruction, Molecules, Wavefronts, Absorbance, Particle image velocimetry, Diffraction gratings, Absorption

Showing 5 of 6 publications
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