Dr. Wumei Lin
at Institute of Optics and Electronics CAS
SPIE Involvement:
Author
Publications (18)

PROCEEDINGS ARTICLE | February 10, 2017
Proc. SPIE. 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016)
KEYWORDS: Diffraction, Mirrors, Scattering, Light scattering, Laser scattering, Charge-coupled devices, Ranging, Diffraction gratings

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials
KEYWORDS: Lithography, Diffraction, Monochromatic aberrations, Error analysis, Distortion, Lens design, Monte Carlo methods, Image quality, Modulation transfer functions, Tolerancing

PROCEEDINGS ARTICLE | August 21, 2014
Proc. SPIE. 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
KEYWORDS: Diffraction, Optical design, Diffractive optical elements, Detection and tracking algorithms, Modulation, Numerical simulations, Wave propagation, Beam shaping, Optimization (mathematics), Algorithms

PROCEEDINGS ARTICLE | August 6, 2014
Proc. SPIE. 9281, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Staring arrays, Infrared detectors, Mid-IR, Diffraction, Optical design, Modulation, Imaging systems, Image quality, Modulation transfer functions, Temperature metrology

PROCEEDINGS ARTICLE | August 23, 2013
Proc. SPIE. 8911, International Symposium on Photoelectronic Detection and Imaging 2013: Micro/Nano Optical Imaging Technologies and Applications
KEYWORDS: Polarization, Imaging systems, Quartz, Crystals, Coating, Wave plates, Control systems, Laser crystals, Spiral phase plates, Dielectric polarization

PROCEEDINGS ARTICLE | April 12, 2013
Proc. SPIE. 8683, Optical Microlithography XXVI
KEYWORDS: Beam splitters, Phase shifting, Point diffraction interferometers, Interferometers, Wavefronts, Optical testing, Charge-coupled devices, CCD image sensors, Testing and analysis, Phase shifts

Showing 5 of 18 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top