A new space and time resolved focusing elliptical curved crystal spectrometer has been developed and applied to
diagnose X-ray of laser-produced plasma in 0. 2~2 nm region. According to the theory of Bragg diffraction, four kinds
of crystal including LiF, PET, KAP, and MiCa were choosed as dispersive elements.The distance of crystal lattice
varies from 0.4 to 2.6 nm. Bragg angle is in the range of 30°~67.5°, the spectral detection angle is in 55.4°~134°. The
dispersive crystal sizes are 120×8×0.2mm.The characteristic of optical system is an elliptical geometry.The X-ray
source is located at the front focal point.The X-rays diffracted by the elliptically curved crystal are focused at the rear
focal point where a width-adjustable exit slit is positioned.The Curved crystal spectrometer mainly consists of dispersive
elements, vacuum configuration, aligning device, spectral detectors and three dimensional (3D) micro-adjustment
devices. The spectrographic experiment was carried out on the XG-2 laser facility.The PET and KAP crystals are
adopted as the dispersive elements,which measure X-ray in the 0.44~0.81 and 1.33~2.46nm region. Emission
spectrum of Al plasmas and Ti plasmas have been successfully recorded by using X-ray CCD camera. It is demonstrated
experimentally that the measured wavelength is accorded with the theoretical value. At the same time, experimental
result shows that spectral resolution of PET and KAP crystals is 956 and 1123.
A new crystal spectrometer has been designed and fabricated for measuring laser-plasma x-ray in the 0.99-1.83-nm region. The cleaved mica crystal with 0.2-mm thickness was curved and glued on an elliptical substrate as the dispersive element. The x-ray source and exit slit are respectively placed at the first and second focal point of the elliptical crystal. The x-ray is diffracted by the mica crystal and focused at the exit slit. An x-ray sensitive charge coupled device or streak camera can be easily amounted in the perpendicular orientation to record the space and time resolved x-ray spectra. The spectrometer was tested at the XG-2 laser facility, and the experimental result shows that the maximum spectral resolution is 999.
A novel elliptical crystal spectrometer has been designed and manufactured to diagnose pulsed plasmas x-ray. The light path is designed according to the elliptical focusing property. The spectrometer is composed of the elliptical x-ray analyzer, the alignment devices, the vacuum system, the ports of the spectral detectors for x-ray CCD camera and x-ray streak camara, the supporting base, and the adapting flange to the target chamber. The target-shooting experiment was performed at the XG-Π and SGΠlaser facilities for testing the spectrometer. The optical system, optoelectronic machinery system, experimental results are discussed in this paper.
In order to measure laser-produced plasma x-ray in the 1.33-2.46-nm region, an elliptical crystal spectrograph has been designed and fabricated. The potassium acid phthalate (KAP) crystal with a 2d spacing of 2.663 nm is used as the x-ray dispersive element, it is elliptically bent and glued on a rustless-steel substrate with a 0.9586 eccentricity and a 1350-mm focal distance. The spectrograph is equipped with an x-ray charge-coupled device (CCD) camera for recording the space-resolved spectrum on one port, and an x-ray streak camera for recording the time-resolved spectrum on another port. The first testing experiment was carried out on the XG-2 target chamber, the experimental results demonstrate that the spectral resolution is about 640 for this spectrograph.