Dr. Xianfeng Ni
Post-Doctural Researcher at Virginia Commonwealth Univ
SPIE Involvement:
Author
Publications (28)

PROCEEDINGS ARTICLE | March 4, 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Silica, Etching, Nickel, Dielectrics, Atomic force microscopy, Scanning electron microscopy, Gallium nitride, Plasma etching, Metalorganic chemical vapor deposition, Epitaxial lateral overgrowth

PROCEEDINGS ARTICLE | March 4, 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Light emitting diodes, External quantum efficiency, Electrodes, Surface roughness, Oxygen, Transmission electron microscopy, Gallium nitride, 3D metrology, Indium gallium nitride, Transparent conducting oxide

PROCEEDINGS ARTICLE | March 4, 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Statistical analysis, Ultraviolet radiation, Photons, Interfaces, Chemical vapor deposition, Oxygen, Gallium nitride, Adsorption, Metalorganic chemical vapor deposition, Vapor phase epitaxy

PROCEEDINGS ARTICLE | March 4, 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Polishing, Crystals, X-ray diffraction, Resistance, Gallium nitride, Sapphire, Aluminum, Epitaxy, Semiconducting wafers, Heterojunctions

PROCEEDINGS ARTICLE | March 3, 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Quantum wells, Magnesium, Luminescence, Doping, Gallium nitride, Phonons, Excitons, Metalorganic chemical vapor deposition, Acoustics, Nanowires

PROCEEDINGS ARTICLE | March 20, 2010
Proc. SPIE. 7602, Gallium Nitride Materials and Devices V
KEYWORDS: Oxides, Ultraviolet radiation, Microscopy, Atomic force microscopy, Oxygen, Data acquisition, Gallium nitride, Photoemission spectroscopy, Scanning probe microscopy, Gallium

Showing 5 of 28 publications
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