Prof. Xiangdong Jiang
at Univ of Electronic Science and Technology of China
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 8 February 2019
Proc. SPIE. 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging
KEYWORDS: Amorphous silicon, Refractive index, Prisms, Surface plasmons, Metals, Silicon, Silver

Proceedings Article | 2 September 2014
Proc. SPIE. 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging
KEYWORDS: Oxides, Vanadium, Thin films, Refractive index, Optical properties, Sputter deposition, Power supplies, Transmittance, Plasma, Absorption

Proceedings Article | 23 December 2013
Proc. SPIE. 9043, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing
KEYWORDS: Oxides, Vanadium, Thin films, Refractive index, Sputter deposition, Crystals, Oxygen, Temperature metrology, Plasma, Absorption

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