Prof. Xiang Peng
at Shenzhen Univ
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Publications (76)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10751, Optics and Photonics for Information Processing XII
KEYWORDS: Image encryption, Fourier transforms, Numerical simulations, Neural networks, Optical image encryption, Neurons, Cryptanalysis

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Point spread functions, Scattering, Image processing, Light scattering, Image restoration, Deconvolution

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Optical transfer functions, Imaging systems, Spatial frequencies, Scattering media

PROCEEDINGS ARTICLE | July 24, 2018
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Imaging systems, Spatial frequencies, Cameras, Image processing, Microscopy, Stereo vision systems

PROCEEDINGS ARTICLE | July 24, 2018
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: 3D acquisition, Imaging systems, Cameras, Sensors, Calibration, Error analysis, Data acquisition, 3D metrology, Optimization (mathematics), Robot vision

PROCEEDINGS ARTICLE | July 24, 2018
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Imaging systems, Cameras, Calibration, Image processing, Phase shift keying, 3D modeling, 3D metrology, Projection systems, Phase measurement, Phase shifts

Showing 5 of 76 publications
Conference Committee Involvement (15)
Optical Design and Testing VIII
11 October 2018 | Beijing, China
Holography, Diffractive Optics, and Applications VIII
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Design and Testing VII
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Showing 5 of 15 published special sections
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