Prof. Xiang Peng
at Shenzhen Univ
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Publications (84)

Proceedings Article | 17 April 2020
Proc. SPIE. 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications
KEYWORDS: 3D acquisition, Calibration, Remote sensing, Clouds, 3D modeling, Image registration, Photogrammetry, Machine vision, 3D scanning, 3D image processing

Proceedings Article | 30 March 2020
Proc. SPIE. 11351, Unconventional Optical Imaging II
KEYWORDS: Real time imaging, Speckle, Scattering media, Neural networks

Proceedings Article | 12 March 2020
Proc. SPIE. 11438, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
KEYWORDS: Modulation, Imaging systems, Phase shift keying, 3D modeling, 3D metrology, Projection systems, Structured light

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Metrology, Microlens array, Cameras, Sensors, Calibration, Image processing, Optical testing, Image sensors, Signal detection, 3D image processing

Proceedings Article | 18 November 2019
Proc. SPIE. 11187, Optoelectronic Imaging and Multimedia Technology VI
KEYWORDS: Optical filters, Logic, Safety, Modulation, Resistance, Feature extraction, Speckle pattern, Multiple scattering

Showing 5 of 84 publications
Conference Committee Involvement (22)
Optical Design and Testing X
11 October 2020 | Beijing, China
Holography, Diffractive Optics, and Applications X
11 October 2020 | Beijing, China
Optical Metrology and Inspection for Industrial Applications VII
11 October 2020 | Beijing, China
Optical Design and Testing IX
21 October 2019 | Hangzhou, China
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Showing 5 of 22 Conference Committees
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