Dr. Xiang Xia
at Univ of Electronic and Technology of China
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Reflectors, Mirrors, FT-IR spectroscopy, Interferometers, Sensors, Spectroscopy, Infrared spectroscopy, Data acquisition, Dynamical systems, Signal detection

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top