Dr. Xiangdong Xu
at Univ of Electronic Science and Technology of China
SPIE Involvement:
Author
Publications (22)

Proceedings Article | 2 September 2014 Paper
Proc. SPIE. 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging
KEYWORDS: Vanadium, Sputter deposition, Thin films, Refractive index, Optical properties, Absorption, Oxides, Transmittance, Plasma, Power supplies

Proceedings Article | 23 December 2013 Paper
Proc. SPIE. 9043, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing
KEYWORDS: Sputter deposition, Vanadium, Thin films, Oxides, Plasma, Crystals, Absorption, Temperature metrology, Oxygen, Refractive index

Proceedings Article | 22 October 2010 Paper
Proc. SPIE. 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
KEYWORDS: Vanadium, Oxides, Sputter deposition, FT-IR spectroscopy, Optics manufacturing, Optical testing, Optoelectronics, Optoelectronic devices, Image sensors, Sensors

Proceedings Article | 11 March 2008 Paper
Proc. SPIE. 6984, Sixth International Conference on Thin Film Physics and Applications
KEYWORDS: Thin films, Glasses, Silicon, Vanadium, Resistance, Oxides, Crystals, Sputter deposition, Thin film deposition, Atomic force microscopy

Proceedings Article | 11 March 2008 Paper
Proc. SPIE. 6984, Sixth International Conference on Thin Film Physics and Applications
KEYWORDS: Thin films, Resistance, Temperature metrology, Vanadium, Sputter deposition, Oxides, Atomic force microscopy, Thin film deposition, Scattering, Thin film devices

Showing 5 of 22 publications
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