Prof. Xiangqian Jiang
Professor at Univ of Huddersfield
SPIE Involvement:
Publications (28)

Proceedings Article | 1 April 2020
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Fringe analysis, Metrology, Imaging systems, Cameras, Calibration, Image processing, Distortion, Deflectometry, Optimization (mathematics)

Proceedings Article | 7 March 2019
Proc. SPIE. 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Confocal microscopy, Metrology, Sensors, Error analysis, Monte Carlo methods, Algorithm development

Proceedings Article | 18 August 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Linear polarizers, Optical filters, Phase shifting, Polarization, Interferometers, Cameras, Interferometry, Standards development, Phase shifts, RGB color model

Proceedings Article | 24 July 2018
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Light sources, Fringe analysis, Phase shifting, Metrology, Interferometers, Fourier transforms, Interferometry, Phase retrieval

SPIE Journal Paper | 28 March 2018
OE Vol. 57 Issue 03
KEYWORDS: Digital holography, Holography, Microscopy, Digital filtering, Optical filters, Speckle, Denoising, Optical engineering, Image filtering, Wavelets

Showing 5 of 28 publications
Conference Committee Involvement (1)
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
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