Dr. Xiangqian Jiang
Professor at Univ of Huddersfield
SPIE Involvement:
Conference Program Committee | Author
Publications (26)

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Linear polarizers, Optical filters, Phase shifting, Polarization, Interferometers, Cameras, Interferometry, Standards development, Phase shifts, RGB color model

PROCEEDINGS ARTICLE | July 24, 2018
Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
KEYWORDS: Light sources, Fringe analysis, Phase shifting, Metrology, Interferometers, Fourier transforms, Interferometry, Phase retrieval

SPIE Journal Paper | March 28, 2018
OE Vol. 57 Issue 03
KEYWORDS: Digital holography, Holography, Microscopy, Digital filtering, Optical filters, Speckle, Denoising, Optical engineering, Image filtering, Wavelets

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Mathematical modeling, Fringe analysis, 3D acquisition, Visual process modeling, Calibration, 3D modeling, Deflectometry, 3D metrology, Projection systems, Phase measurement, 3D displays, 3D imaging metrology

PROCEEDINGS ARTICLE | November 24, 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Mathematical modeling, Mirrors, Beam splitters, Fringe analysis, Imaging systems, Cameras, Calibration, CCD cameras, LCDs, 3D metrology

PROCEEDINGS ARTICLE | October 31, 2016
Proc. SPIE. 10021, Optical Design and Testing VII
KEYWORDS: Chromatic aberrations, Fringe analysis, 3D acquisition, Imaging systems, Cameras, Calibration, Computing systems, LCDs, Color difference, 3D metrology

Showing 5 of 26 publications
Conference Committee Involvement (1)
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
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