Prof. Xianyu Su
Director of 3-D Sensing and Machine Vision Lab at Sichuan Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (88)

PROCEEDINGS ARTICLE | December 4, 2017
Proc. SPIE. 1230, International Conference on Optoelectronic Science and Engineering '90

SPIE Journal Paper | October 26, 2017
OE Vol. 56 Issue 10
KEYWORDS: Distortion, Imaging systems, Calibration, Cameras, Projection systems, Optical engineering, Computer simulations, Associative arrays, Fringe analysis, Phase measurement

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
KEYWORDS: Mirrors, Fringe analysis, Metrology, Reflection, Calibration, Photogrammetry, Deflectometry

SPIE Journal Paper | October 10, 2017
OE Vol. 56 Issue 10
KEYWORDS: Computer programming, Binary data, 3D metrology, Cameras, 3D image processing, Projection systems, Calibration, Reconstruction algorithms, 3D image reconstruction, 3D acquisition

SPIE Journal Paper | March 25, 2017
OE Vol. 56 Issue 03
KEYWORDS: Modulation, Fourier transforms, Projection systems, Cameras, Fringe analysis, Picosecond phenomena, Phase shifts, Calibration, Control systems, Digital micromirror devices

SPIE Journal Paper | March 11, 2017
OE Vol. 56 Issue 03
KEYWORDS: Modulation, Wavelet transforms, Fourier transforms, Fringe analysis, Wavelets, Phase shift keying, Computer simulations, Optical testing, Error analysis, 3D metrology

Showing 5 of 88 publications
Conference Committee Involvement (6)
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications III
5 May 2014 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications II
25 August 2013 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Interferometry XII: Applications
4 August 2004 | Denver, Colorado, United States
Showing 5 of 6 published special sections
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