Prof. Xiao-yi Lv
at Xinjiang Univ
SPIE Involvement:
Author
Publications (28)

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Nanoparticles, Metals, Water, Silicon, Surface enhanced Raman spectroscopy, Raman spectroscopy, Pollution, Raman scattering, Chemical elements, Arsenic

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Nanoparticles, Metals, Ions, Silicon, Silver, Chemistry, Corrosion, Surface enhanced Raman spectroscopy, Raman spectroscopy, Raman scattering

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Detection and tracking algorithms, Data modeling, Pattern recognition, Spectroscopy, Feature extraction, Pollution, UV-Vis spectroscopy, Water contamination, Statistical modeling, Quality testing methods

Proceedings Article | 19 February 2018 Paper
Proc. SPIE. 10607, MIPPR 2017: Multispectral Image Acquisition, Processing, and Analysis
KEYWORDS: Signal to noise ratio, Optical filters, Digital filtering, Wavelets, Denoising, Interference (communication), Raman spectroscopy, Signal processing, Smoothing, Electronic filtering

Proceedings Article | 24 October 2017 Paper
Proc. SPIE. 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications
KEYWORDS: Silicon, Biosensors, Optical microcavities, Optical biosensors

Showing 5 of 28 publications
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