Based on the Real Right Law, this article analyzes the entity objects of the realty uniform registration, and establishes the model of the logical relations among the entities, from which the dada relation model is proposed, and from which the data relation model of the realty uniform registration is proposed, and is compared with the current land registration data model and the real estate data model. It is proved that this uniform registration data model has not only maintained the close links with the land registration data model and the real estate registration data model, but also met the need of the uniform registration by comparing with the existing land registration data model and the real estate data model. In the end, this article discusses the method of data storage for the uniform registration of the land and the real estate to improve the efficiency of storage and access by adopting split technology to store the alteration data logically.
The combination of scanning near field optical microscopy (SNOM) and Raman spectroscopy provides specific spectra information with nanometer spatial resolution beyond the diffraction limit, which has a wide range of potential applications and can help to understand the interactions between light and matter in nanometer scale. In this paper, a near-field Raman spectroscopy experimental setup has been developed by using an apertureless SNOM system. An Ar+ laser (514nm ) is focused at an angle onto the sample surface. The metallized tip is an Au-layer-coated cantilever of an atomic force microscopy and working in the contact mode. The near field Raman spectra signal can be detected when the tip approached the sample surface. In addition, the apertureless SNOM appears to have greater potential resolution than aperture-type SNOM system. Furthermore, the reflection geometry employed in this experiment allows no need for specific sample preparation, making near field spectrum study a reality for any samples. The reflected near field Raman spectra signal is collected by a microscope objective. Finally, the near field Raman spectra of monocrystalline silicon are presented.