Dr. Xiaobin Yuan
at Lehigh Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 6, 2006
Proc. SPIE. 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
KEYWORDS: Microelectromechanical systems, Packaging, Accelerated life testing, Switches, Data modeling, Silica, Electrodes, Dielectrics, Electrons, Reliability

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