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Dr. Xiaobin Yuan
at Lehigh Univ
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Publications (1)
Proceedings Article | 6 January 2006 Paper
A transient charging model to predict actuation-voltage shift in RF MEMS capacitive switches
Xiaobin Yuan, James C. M. Hwang, David Forehand, Charles Goldsmith
Proceedings Volume 6111, 61110G (2006) https://doi.org/10.1117/12.657691
KEYWORDS: Switches, Dielectrics, Microelectromechanical systems, Data modeling, Electrodes, Accelerated life testing, Reliability, Electrons, Packaging, Silica
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