Xiaochuan Hu
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Defect detection, Optical components, Spherical lenses, Imaging systems, Light sources, Light scattering, Light scattering, Light emitting diodes, Light emitting diodes, Scattering, Scattering, Interferometers, Interferometers, Visibility, Visibility

Proceedings Article | 26 April 2019 Presentation + Paper
Proc. SPIE. 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI
KEYWORDS: Interferometry, X-rays, Optical testing, X-ray optics, Optical fabrication

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