Prof. Xiaodong Wang
at Dalian Univ of Technology
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Mirrors, Light sources, Polishing, Image segmentation, Image processing, Silicon, Control systems, CCD cameras, Image filtering, Semiconducting wafers

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Sensors, Calibration, Control systems, Head, Finite element methods, Machine vision, Visual system, Aluminum, Charge-coupled devices, Assembly equipment

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Microelectromechanical systems, Crystals, Silicon, Silver, Resistance, Doping, Boron, Epoxies, Semiconducting wafers, Adhesives

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Visualization, Imaging systems, Cameras, Calibration, Image processing, CCD cameras, Precision measurement, Machine vision, System integration, Assembly equipment

PROCEEDINGS ARTICLE | January 31, 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Visualization, Imaging systems, Cameras, Calibration, Image processing, CCD cameras, Precision measurement, Machine vision, Assembly equipment, 3D image processing

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