Xiaofei Wu
PhD Candidate at Univ of Hong Kong
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 15 March 2016 Paper
Proceedings Volume 9780, 97800Q (2016) https://doi.org/10.1117/12.2220278
KEYWORDS: Photomasks, Electroluminescent displays, Critical dimension metrology, Lithography, Error analysis, Computational lithography, Source mask optimization, Optimization (mathematics), Electron beam lithography, Stochastic processes

Proceedings Article | 13 March 2012 Paper
Xiaofei Wu, Shiyuan Liu, Shuang Xu, Xinjiang Zhou, Wei Liu
Proceedings Volume 8326, 832629 (2012) https://doi.org/10.1117/12.916190
KEYWORDS: Lithography, Photomasks, Algorithm development, Imaging systems, Optical lithography, Fourier transforms, Genetic algorithms, Metrology, Computer simulations, Image storage

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