Dr. Xiaofeng Lin
at Zhejiang Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Metrology, Optical amplifiers, Calibration, Scanners, Crystals, Atomic force microscopy, Atomic force microscope, Feedback loops, Scanning tunneling microscopy, Scanning probe microscopes

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Iron, Metals, Image processing, Corrosion, Image acquisition, Control systems, Atomic force microscopy, Atomic force microscope, Feedback control, Liquids

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