In this paper, we extend the spectrography method to visualize 3D structures of complex samples from only one spectral view. Utilizing a weighted difference map and the Fourier central slice theorem, a number of Fourier planes are reconstructed, which go through the origin of the 3D Fourier space and interact with a region formed by the Ewald spheres. Thus, the complex x-ray wave fronts can be recovered at small tilting angles from the incident x-ray beam. Patterns from various computed projections can generate perception of 3D structure features inside the sample. To demonstrate the feasibility of the proposed spectrographic imaging method, numerical simulations are performed and analyzed. The results suggest that spectrography is an effective method for 3D structure studies by a single spectral exposure.