Xiaoman Zhang
at China Jiliang Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 December 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Metrology, Image processing, Error analysis, Computing systems, Precision measurement, Photomasks, Charge-coupled devices, Data corrections, Systems modeling, Laser systems engineering

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