Prof. Xiaoping Wu
at Univ of Science and Technology of China
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (32)

PROCEEDINGS ARTICLE | September 18, 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Staring arrays, Thermography, Superposition, Image fusion, Infrared imaging, Image processing, Diffusion, Image restoration, Infrared radiation, Image enhancement

SPIE Journal Paper | October 14, 2013
OE Vol. 52 Issue 10
KEYWORDS: Phase shifting, Charge-coupled devices, Digital holography, Polarization, Numerical simulations, Phase measurement, Polarizers, 3D image reconstruction, Image quality, Beam splitters

SPIE Journal Paper | February 6, 2012
OE Vol. 51 Issue 1
KEYWORDS: Holograms, Detection and tracking algorithms, Optical tweezers, Holography, Binary data, Holography applications, Spatial light modulators, Optical simulations, Reconstruction algorithms, Optical design

PROCEEDINGS ARTICLE | April 12, 2005
Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
KEYWORDS: Carbon, Fringe analysis, Phase shifting, Modulation, Image segmentation, Image processing, Reflectivity, Distortion, CCD cameras, Mechanical engineering

PROCEEDINGS ARTICLE | April 12, 2005
Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
KEYWORDS: Optical design, Phase shifting, Veins, Cameras, Kinematics, CCD cameras, Projection systems, Phase measurement, Aerodynamics, Experimental mechanics

PROCEEDINGS ARTICLE | December 30, 2004
Proc. SPIE. 5641, MEMS/MOEMS Technologies and Applications II
KEYWORDS: Staring arrays, Microelectromechanical systems, Gold, Thermography, Infrared imaging, Imaging systems, Sensors, Silicon, Scanning electron microscopy, Infrared radiation

Showing 5 of 32 publications
Conference Committee Involvement (4)
Optical Micro- and Nanometrology in Microsystems Technology
8 April 2008 | Strasbourg, France
Optical Micro- and Nanometrology in Microsystems Technology
5 April 2006 | Strasbourg, France
Optical Micro- and Nanometrology in Manufacturing Technology
29 April 2004 | Strasbourg, France
Third International Conference on Experimental Mechanics
14 February 2002 | Beijing, China
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