Xiaoyi Gu
at Laird Technologies
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 February 2013 Paper
Jeff Hershberger, Robert Smythe, Xiaoyi Gu, Richard Hill
Proceedings Volume 8606, 86060T (2013) https://doi.org/10.1117/12.2002067
KEYWORDS: Copper, Thermoelectric materials, Semiconductors, Resistance, Aluminum nitride, Photography, Control systems, Dielectrics, Optical components, Temperature metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top