Xiaozhen Wang
at University of Ottawa
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | March 8, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Wafer-level optics, Defect detection, Polarization, Imaging systems, Scattering, Silicon, Inspection, Computer simulations, Bridges, Semiconducting wafers, Signal detection, Electromagnetism, Near field optics, Defect inspection

PROCEEDINGS ARTICLE | October 17, 2012
Proc. SPIE. 8421, OFS2012 22nd International Conference on Optical Fiber Sensors
KEYWORDS: Refractive index, Cladding, Sensors, Single mode fibers, Fiber optics sensors, Optical testing, Data acquisition, Reflectometry, Spatial resolution, Signal detection

PROCEEDINGS ARTICLE | May 17, 2011
Proc. SPIE. 7753, 21st International Conference on Optical Fiber Sensors
KEYWORDS: Optical filters, Mirrors, Fabry–Perot interferometers, Optical amplifiers, Reflection, Reflectivity, Multiplexing, Single mode fibers, Fiber lasers, Tunable filters

PROCEEDINGS ARTICLE | October 5, 2009
Proc. SPIE. 7503, 20th International Conference on Optical Fibre Sensors
KEYWORDS: Signal to noise ratio, Refractive index, Interferometers, Sensors, Metals, Single mode fibers, Fiber optics sensors, Fiber couplers, Acoustic emission, Acoustics

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