Prof. Ximing Chen
at Tianjin Univ of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 29 November 2011
Proc. SPIE. 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
KEYWORDS: Semiconductors, Thin films, FT-IR spectroscopy, Modulation, Sputter deposition, Crystals, X-ray diffraction, Atomic force microscopy, Boron, Piezoelectric effects

Proceedings Article | 26 November 2007
Proc. SPIE. 6829, Advanced Materials and Devices for Sensing and Imaging III
KEYWORDS: Thin films, Chemical species, Sputter deposition, Glasses, Crystals, Silicon, Scanning electron microscopy, Zinc oxide, Thin film deposition, Temperature metrology

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