Xin Huang
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 December 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Ferroelectric materials, Sensors, Ceramics, Laser applications, Resistance, Control systems, Data acquisition, Transducers, Precision measurement, Bridges

Proceedings Article | 8 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Photovoltaics, Mirrors, Statistical analysis, Interferometers, Calibration, Error analysis, Interferometry, Computer generated holography, Precision measurement, Analytical research

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