Xin Pei
at Civil Aviation Univ of China
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Light sources, Cameras, Inspection, 3D modeling, 3D metrology, Algorithm development, Prototyping, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top