Xin Tan
at Hebei Semiconductor Research Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 April 2020 Paper
Proc. SPIE. 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications
KEYWORDS: Photon counting, Avalanche photodetectors, Ultraviolet radiation, Single photon, Resistance, Avalanche photodiodes, Silicon carbide, Resistors, Ultraviolet detectors

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