Xin Wang
at Aprio Technologies Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 May 2005 Paper
Xin Wang, Mark Pillof, Hongbo Tang, Clive Wu
Proceedings Volume 5756, (2005) https://doi.org/10.1117/12.599830
KEYWORDS: Optical proximity correction, Resolution enhancement technologies, Model-based design, Manufacturing, Pollution control, Data modeling, Process modeling, Optical lithography, Optics manufacturing, Industrial chemicals

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