Dr. Xin Xie
Assistant Professor at
SPIE Involvement:
Profile Summary

Xin Xie is currently a Research Assistant, PhD candidate at Optical Lab, Oakland University, United State of America. He received Bachelor of Engineering in Precision Instrumentation Science from Hefei University of Technology in 2010 and Master of Science in Mechanical Engineering from Oakland University in 2012. His main research interests include optical metrology, phase-shift technology, digital shearography, non-destructive testing, quality inspection and material behavior testing.

From 2012 to now, he has published 22 journal/conference papers and received more than 90 citations. 2 PCT patents under his name are in processing.
Publications (3)

SPIE Press Book | 20 April 2016
KEYWORDS: Shearography, Phase shifts, Nondestructive evaluation, Speckle pattern, Speckle, CCD cameras, Cameras, Phase measurement, Fringe analysis, Mirrors

Proceedings Article | 4 March 2015
Proc. SPIE. 9302, International Conference on Experimental Mechanics 2014
KEYWORDS: Mirrors, Beam splitters, Mach-Zehnder interferometers, Fourier transforms, Nondestructive evaluation, Phase interferometry, CCD cameras, Speckle pattern, Shearography, Michelson interferometers

Proceedings Article | 10 October 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Beam splitters, Optical signal processing, Digital holography, Speckle, Interferometry, Speckle pattern, 3D metrology, Optical engineering, Shearography, Phase shifts

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