Mr. Xinfeng He
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 16, 2013
Proc. SPIE. 9068, Eighth International Conference on Thin Film Physics and Applications
KEYWORDS: Vanadium, Thin films, Refractive index, Optical design, Optical properties, Sputter deposition, Transmittance, Infrared radiation, System on a chip, Oxidation

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