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Xing Yu
at Sichuan Univ
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Publications (1)
Proceedings Article | 2 September 2014 Paper
Characteristic analysis on the thermal noise of infrared CCD
Proc. SPIE. 9284, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronics Materials and Devices for Sensing and Imaging
KEYWORDS: Thermography, Infrared imaging, Mercury cadmium telluride, Sensors, Thermal effects, Infrared radiation, Optical simulations, Charge-coupled devices, Temperature metrology, Absorption
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