Mr. Xingrui Wang Profile

Xingrui Wang

PhD Candidate at Tongji Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 24 April 2020 Presentation

High strain Peano-HASEL actuators (Conference Presentation)

Shane Mitchell, Xingrui Wang, Ellen Rumley, Philipp Rothemund, Hyeong-Joon Joo, Christoph Keplinger

Proceedings Volume 11375, 113750Z (2020) https://doi.org/10.1117/12.2557123

KEYWORDS: Actuators, Robots, Prototyping, Electrodes, Heart, Robotic systems

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Proceedings Article | 29 March 2019 Presentation

Rapid prototyping zipping HASEL actuators for high-speed and versatile artificial muscles (Conference Presentation)

Shane Mitchell, Xingrui Wang, Eric Acome, Trent Martin, Khoi Ly, Nicholas Kellaris, Christoph Keplinger

Proceedings Volume 10966, 1096609 (2019) https://doi.org/10.1117/12.2514325

KEYWORDS: Actuators, Rapid manufacturing, Artificial muscles, Fabrication, Electronics, Prototyping, Robotics

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SPIE Journal Paper | 5 December 2018

Process optimization of selective wet etching for fabrication of high-aspect-ratio and uniform multilayer grating reference materials

Longfei Zhang, Xingrui Wang, Xinbin Cheng, Xiao Deng

JM3, Vol. 17, Issue 04, 044003, (December 2018) https://doi.org/10.1117/12.10.1117/1.JMM.17.4.044003

KEYWORDS: Etching, Multilayers, Wet etching, Ultrasonics, Signal processing, Line edge roughness, Scanning electron microscopy, Transmission electron microscopy, Calibration, Reactive ion etching

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Proceedings Article | 15 September 2016 Presentation + Paper

Fabrication and characterization of one-dimensional multilayer gratings for nanoscale microscope calibration

Xingrui Wang, Yang Zhao, Jie Liu, Jie Chen, Tongbao Li, Xinbin Cheng

Proceedings Volume 9927, 99270M (2016) https://doi.org/10.1117/12.2236866

KEYWORDS: Multilayers, Microscopes, Calibration, Etching, Silicon, Polishing, Transmission electron microscopy, Image processing, Adhesives, Silica

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Proceedings Article | 15 September 2016 Presentation + Paper

Characterization of one-dimensional gratings fabricated by laser-focused atomic deposition

Jie Liu, Xinbin Cheng, Jie Chen, Xingrui Wang, Xiao Deng, Yan Ma, Tongbao Li

Proceedings Volume 9927, 99270K (2016) https://doi.org/10.1117/12.2235906

KEYWORDS: Metrology, Chromium, Atomic force microscopy, Calibration, Chemical species, Laser stabilization, Scanning electron microscopy, Standards development, Manufacturing, Atomic force microscope

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