Xingyu Yao
at Liaoning Institute of Measurement
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 October 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Light sources, Reflection, Interferometers, Optical testing, Uncertainty analysis, Quantization, Charge-coupled devices, Precision optics, Phase shifts, Light

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