Mr. Xinyi Yu
at Harbin Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 30, 2003
Proc. SPIE. 5264, Optomechatronic Systems IV
KEYWORDS: Light scattering, Surface roughness, Optical testing, Semiconductor lasers, Head, Measurement devices, Charge-coupled devices, Raster graphics, CCD image sensors, Radium

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