Xiuling Ye
at Tianjin Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mathematical modeling, Error analysis, Composites, Manufacturing, 3D modeling, Optoelectronics, Distance measurement, Instrumentation engineering, Tolerancing, Standards development

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Metrology, Optical spheres, Interferometers, Cameras, Sensors, Video, Error analysis, Inspection

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