Xiwen Wang
at Soochow Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Microscopes, Speckle, Optical coherence tomography, Image processing, Coating, Nondestructive evaluation

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Optical imaging, Multilayers, 3D image reconstruction, Imaging systems, Scattering media, Opacity, Optical coherence tomography, Medical diagnostics, Nondestructive evaluation, Spatial resolution

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